Sigenics News

• Sigenics acquires new prober
  July 2012: Sigenics acquired a new automatic wafer prober to enhance out in-house production test capability
• Sigenics delivers first of QFN32 packaged devices
  July 2012: Destined for use in electronic test equipment, this RF device is packaged in a 32 pin QFN package and tested to specification on Sigenics-constructed test equipment.

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